Description: Author: Paul R. Gray Paul J. Hurst Stephen H. Lewis Robert G. Meyer

The fourth edition features coverage of cutting edge topics--more advanced CMOS device electronics to include short-channel effects, weak inversion and impact ionization. In this resourceful book find: * Coverage of state-of-the-art IC processes shows how modern integrated circuits are fabricated, including recent issues like heterojunction bipolar transistors, copper interconnect and low permittivity dielectric materials * Comprehensive and unified treatment of bipolar and CMOS circuits.

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